The scanning probe microscope (SPM) consists a family of microscopy forms where a sharp probe is scanned across a surface where the probe/sample interaction or interactions are monitored.  The two primary forms of SPM are scanning tunneling microscopy (STM) and atomic force microscopy (AFM). 

Specifications:

• conduct both contact and tapping mode
• multi-tasking SPM;  STM, LFM, MFM, & EFM
• additional accessories (fluid cell) allows AFM to conduct tapping mode fluid microscopy
• max sample sizes that can be studied: 200mm diameter, and 12mm thick
• SPM/AFM scanner has maximum horizontal imaging area of 90mm x 90mm
• signal access module for the nanoscope SPM control station

CASE Applications:

• surface topography of metal/polymer mixes
• analysis of microdevice fabrication stages
• electric domains of metal/polymers mixes to make comparison with surface topography
• DNA imaging (biosensors applications) with fluid cell.